Monte Carlo simulation of reliability of electronic components of very large-scale integrated circuits
https://doi.org/10.21822/2073-6185-2025-52-3-49-60
Abstract
Objective. Development of a methodology for assessing the reliability of electronic components of very large-scale integrated circuits using stochastic modeling by the Monte Carlo method for failure prediction and reliability parameter optimization.
Method. The Monte Carlo statistical testing method was applied to model the degradation processes of VLSI electronic components. A mathematical model was developed that takes into account the influence of temperature, humidity, mechanical stresses and electrical loads on reliability parameters. 10 simulation iterations were performed.
Result. Statistical distributions of failure-free operation time for various types of VLSI components were obtained. Temperature influences contribute most to reliability degradation (52.0%), humidity – 29.4%, mechanical stress – 22.8%, and electrical loads – 12.7%. The model demonstrates a prediction accuracy of 95.5% when compared with experimental data.
Conclusion. The Monte Carlo method provides effective modeling of the reliability of VLSI electronic components taking into account multiple impact factors. The proposed methodology allows optimizing design parameters and operating modes to improve reliability by 12-15%.
About the Authors
T. I. Isabekova
Daghestan State Technical University
Russian Federation
Russian Federation
Tamila I. Isabekova - Cand. Sci. (Physic. and Mathemat.), Assoc. Prof., Head of the Department of Applied Mathematics and Informatics.
25 Dzhamalutdin Ataev Str., Makhachkala 367008
S. E. Savzikhanova
Daghestan State Technical University
Russian Federation
Russian Federation
Sabina E. Savzikhanova - Dr. Sci. (Econom.), Prof., Department of Information Technologies and Information Security.
25 Dzhamalutdin Ataev Str., Makhachkala 367008
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Review
For citations:
Isabekova T.I., Savzikhanova S.E. Monte Carlo simulation of reliability of electronic components of very large-scale integrated circuits. Herald of Dagestan State Technical University. Technical Sciences. 2025;52(3):49-60. (In Russ.) https://doi.org/10.21822/2073-6185-2025-52-3-49-60
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